摘要
讨论了数字集成电路的在线测试原理及硬件结构。
The principle of in circuit test for digit IC and hardware test construct have been discussed. A method of software test that combines LEAD testing with pseudo exhaustive testing is given.
出处
《西安工业学院学报》
1997年第1期61-65,共5页
Journal of Xi'an Institute of Technology
