摘要
将衍射光栅干涉和CMOS线阵图像传感器技术相结合,提出了自动测量透明材料折射率的方法.介绍了用CMOS线阵图像传感器来实现透明材料折射率测量的基本原理和数据采集方法.采用曲线拟合计算条纹移动距离,提高了对干涉条纹移动量测量的准确性,折射率精度可提高到10-5数量级.
Based on the interference of diffraction grating and the technology of CMOS linear image sensor, the refraction index of transparent materials is measured automatically. First, the fundamentals of CMOS linear image sensor is analyzed and the introduction about data sampling is given. Then, the method to compute the displacement of the interference stripe is presented using curve fitting of the data. With this method, the measurement accuracy of the displacement of the interference stripe is improved. The precision of the refraction index can reach 10^-5.
出处
《物理实验》
2007年第10期7-10,共4页
Physics Experimentation
基金
国家自然科学基金项目资助(No.60331010)
关键词
折射率
透明材料
CMOS线阵图像传感器
干涉条纹
refraction index
transparent materials
CMOS linear image sensor
interference stripe
