Tl_2Ba_2CaCu_2O_8高温超导薄膜中的本征约瑟夫森效应

INTRINSIC JOSEPHSON EFFECTS IN Tl_2Ba_2CaCu_2O_8 HIGH-T_c SUPERCONDUCTING THIN FILMS

我们在不同温度下对Tl2Ba2Cu2Cu2O8高温超导薄膜进行了本征约瑟夫森效应研究．对薄膜微桥I—V特性和临界电流随温度变化关系的测试表明，Tl2Ba2CaCu2O8薄膜中的本征约瑟夫森效应呈现SIS结特性．

he intrinsic Josephson effects in Tl2Ba2CaCu2O8 thin films have been investigated atdifferent temperatures. The experimental results of I-V characteristics and the temperature dependence of critical currents show that the intrinsic Josephson junctions inTI2Ba2CaCu2O8 thin films are of the SIS type.