期刊文献+

氧离子束辅助沉积氧化铪薄膜的激光损伤阈值研究 被引量:5

The investigation of laser-induce damage threshold of HfO_2 films prepared with oxygen ion beam assisted deposition
下载PDF
导出
摘要 电子枪蒸发制备了氧化铪薄膜,对氧离子束辅助和未辅助两种情况下的样品进行了折射率、吸收、激光损伤阈值等属性的测试,结果表明,氧离子束辅助沉积的样品与未辅助沉积的样品相比具有高的折射率和高的吸收,以及稍低的激光损伤阈值。经过分析发现,薄膜的激光损伤阈值是影响薄膜抗激光特性的不利因素和有利因素竞争的结果,离子束辅助沉积技术在引入结构致密等有利因素的同时,也引入了吸收增加等不利因素。 Using e - beam evaporation, HfO2 films were prepared. The characteristics of refractive index, weak absorption, laser - induce damage threshold were measured. It was showed that Hf02 film prepared with ion beam assisted deposition has higher refractive index, higher absorption, and lower laser- induce damage threshold. Through the analysis, it was pointed that the disadvantages and advantages were introduced by IBAD at the same time and laser - induce damage threshold of films were the results of disadvantages and advantages competition.
出处 《激光杂志》 CAS CSCD 北大核心 2007年第3期31-32,共2页 Laser Journal
基金 上海市重点学科建设项目资助 项目编号:T0501
关键词 离子束辅助沉积 氧化铪 激光损伤阈值 微弱吸收 ion beam assisted H fO2 laser- induce damage threshold weak absorption
  • 相关文献

参考文献10

  • 1J.M.Zukic,D.G.Torr,J,F.Spann,and M.R.Torr.Vacuum ultraviolet thin films.1:Optical constants of BaF2,CAF2,LaF3,MgF2,Al2O3,HfO2,and SiO2 thin films[J].Appl.Opt.,1990,29:4284-4292.
  • 2J.D.Traylor Kruschwitz and W.T.Pawlewicz.Optical and durability properities of infrared tranmitting thin films[J].Appl.Opt.,1997,36:2157-2159.
  • 3D.Smith and P.Baumeister.Refractive index of some oxide and fluoide coating materials[J].Appl.Opt.,1979,18:111-115.
  • 4Philippe Torchio,Alexandre Gatto,Marco Alvisi et al.High-Reflectivity HfO2/SiO2 Ultraviolet Mirrors[J].Applied Optics,2002,41 (IS-Sue16):3256-3261)
  • 5Hansjorg Niederwald.Low-temperature deposition of optical coatings using ion assistance[J].Thin solid films,2000,377-378:21-26.
  • 6M.Alvisi,F.De Tomasi,M.R.Perrone,M.L.Protopapa,A.Rizzo,F.Sarto,S.Scaglione.Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films[J].Thin solid films,2001,396:44-52.
  • 7M.Alvisi,M.Di Giulio,S.G.Marrone,M.R.Perrone,M.L.Protopapa,A.Valentini,L.Vasanelli.HfO2 films with high laser damage threshold[J].Thin Solid Films,2000,358:250-258.
  • 8范树海,贺洪波,范正修,邵建达,赵元安.表面热透镜技术应用于薄膜微弱吸收测量的理论和实验[J].物理学报,2005,54(12):5774-5777. 被引量:22
  • 9ISO 11254-1:2000:Lasers and laser-related equipment--Determination of laser-induced damage threshold of optical surfaces-Part 1:1-on-1 test.
  • 10高卫东,张伟丽,范树海,张大伟,邵建达,范正修.HfO_2薄膜的结构对抗激光损伤阈值的影响[J].光子学报,2005,34(2):176-179. 被引量:29

二级参考文献21

  • 1Smith D, Baumeister P. Refractive index of some oxide and fluoride coating materials. Appl Opt, 1979,18(1): 111 ~ 115.
  • 2Chow R, Falabella S, Loomis G E, et al. Reactive evaporation of low-defect hafnia. Appl Opt, 1993,32 (28):5567 ~ 5574.
  • 3Alvisi M, Giulio M Di, Marrone S G, et al. HfO2 films with high laser damage threshold. Thin Sold Films, 2000,358(1-2) :250 ~ 258.
  • 4Reicher D,Black P,Junglinhg K, et al. Defect formation in hafnium dioxide thin films. Appl Opt,2000,39 (10): 1589 ~1599.
  • 5Macleod H A. Thin-Film Optical Filters. Third Edition,Institute of Physics Publishing Bristol and Philadelphia,2001.
  • 6Ritala M, Leskela M, Niinisto L. Development of crystallinity and morphology in hafnium dioxide thin film grown by atomic layer epitaxy. Thin Solid Films, 1994,250(1-2) :72 ~80.
  • 7JCPDS-International Center for Diffraction Data, 1999,PCPDFWIN V. 2.02, Present by Journal of Research of the National Institute of Standards and Technology.
  • 8Kuo P K, Zhang S Y. A new diffraction theory for the mirage effect and thermal lensing. Progress in Natural Science, 1996,6(11): 191 ~ 205.
  • 9Zukic J M, Torr D G, Spann J F, et al. Vacuum ultraviolet thin films. 1: Optical constants of BaF2, CaF2, LaF3,MgF2, Al2O3, HfO2, and SiO2 thin films. Appl Opt, 1990,29 (28) :4284 ~ 4292.
  • 10Kruschwitz, Traylor J D, Pawlewicz W T, et al. Optical and durability properities of infrared transmitting thin films. Appl Opt, 1997,36(21) :57 ~ 2159.

共引文献47

同被引文献58

  • 1高卫东,张伟丽,范树海,张大伟,邵建达,范正修.HfO_2薄膜的结构对抗激光损伤阈值的影响[J].光子学报,2005,34(2):176-179. 被引量:29
  • 2凌秀兰,黄伟,张云洞.节瘤缺陷对薄膜热力损伤的有限元分析[J].光电工程,2005,32(4):16-18. 被引量:1
  • 3Gilo M, Croitoru N. Study of HfOz films prepared by ion-assisted deposition using a gridless end-hall ion source[J]. Thin Solid Films, 1999,380(1-2) : 203-208.
  • 4Zhang D W, Fan S H, Zhao Y A, et al. High laser-induced damage threshold HfO2 films prepared by ion-assisted electron beam evaporation [J]. Applied Surface Science,2005,243(1-4) : 232-237.
  • 5Dijon J, Quesnel E, Rolland B, et al. High damage threshold fluoride UV mirrors made by ion beam sputtering[C]//Proc of SPIE. 1998, 3244: 401-416.
  • 6Dijon J, Rafin B, Pelle C, et al. One hundred joule per square centimeter 1.06μm mirror[C]//Proc of SPIE. 2000,3902: 158-168.
  • 7Alvisi M, DeNunzio G, DtGiulio M, et al. Deposition of SiO2 films with high laser damage thresholds by ion-assisted electron-beam evaporation [J]. Appl Opt,1999, 38(7): 1237-1243.
  • 8Stolz C J, Genin F. Optical interference coatings[M]. Sprimger, 2003:309-333.
  • 9张海良 贾红辉 张学骜等.紫外光大气辐射传输特性研究.中国激光,2009,36(2):108-111.
  • 10贺敏波 江厚满 陈敏孙等.激光斜入射对薄膜光学特性影响的数值分析.光学学报,2011,31(1):1001-1001.

引证文献5

二级引证文献16

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部