应用PTIDR编码压缩的测试资源划分方法

Test Resource Partitioning Using PTIDR Code

提出了一种有效的新型测试数据压缩编码——PTIDR编码。该编码方法综合利用哈夫曼编码和前缀编码。理论分析和实验结果表明,在测试集中,0的概率p满足p≥0.7610时,能取得比FDR编码更高的压缩率,从而降低芯片测试成本。该编码方法的解码器也较FDR编码的解码器简单、易实现,且能有效节省硬件开销,并进一步节省芯片面积,从而降低芯片制造成本。

A novel and efficient code, PTIDR, for test data compression was presented. In this method, Huffman coding and prefix coding were used in combination. Both theoretical analysis and experimental results indicate that, when the probability of 0s in the test set is greater than or equal to 0. 7610, it can acquire better compression efficiency than FDR coding, thereby reducing the test cost of the chip. The decoder of PTIDR code is also simpler, easier to realize and needs less hardware overhead than FDR code, hence reduced chip area, which further reduces manufacturing cost.