摘要
用X射线光电子谱(简称XPS)对金刚石单晶与其表面钛镀膜的扩散反应进行了定量相分析,成功验证了金刚石晶格中的碳原子与钛镀层之间的反应扩散模型。
Quantitative phase analyses on the diffusing reaction of diamond monocrystal and Ti plating film on its surface by using XPS have been made. Reaction diffusing model between C atom in diamond and plating layer has been verified. \
出处
《粉末冶金技术》
CAS
CSCD
北大核心
1997年第2期146-148,共3页
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