期刊文献+

大功率氮化镓基白光LED模组的散热设计 被引量:11

Thermal Design of GaN-based High-power LED Module
下载PDF
导出
摘要 散热设计是大功率发光二极管(LED)模组结构设计的重要环节。首先利用计算流体力学方法对自然对流条件下大功率LED模组的温度场进行了模拟,提出并优化了模组可采用的散热片结构,进而对影响模组散热的其他关键因素进行了分析,结果表明,提高关键封装材料如银胶的热导率能够有效地降低芯片温度,提高芯片温度均匀性;多芯片封装时芯片的整体温度及均匀性相对于单芯片封装皆有改善。优化后的封装结构在5 W电功率注入条件下,芯片结温约60℃。 Thermal management is the key issue for LED module design because luminous efficiency and lifetime of high-power GaN-based white LEDs are limited by heat dissipation. Temperature distribution of LED module under natural convection was simulated using computational fluid dynamics, and structure of fin for 5 W LED module was brought forward and optimized. Then, other key issues impacting heat dissipation were analyzed. The results show that junction temperature can be dramatically decreased by increasing thermal conductivity of attaching materials, and temperature characteristics of multi-chip package are superior to that of single-chip package both in junction temperature and chip temperature uniformity. The junction temperature of chip of the optimized module is about 60 ℃ under 5 W injection power.
出处 《半导体光电》 EI CAS CSCD 北大核心 2007年第5期627-630,共4页 Semiconductor Optoelectronics
基金 国家自然科学基金项目(60536020 60390074) 国家"973"计划项目(2006CB302801 2006CB302804 2006CB302806) 国家"863"计划项目(2006AA03A105) 北京市科委重大计划资助项目(D0404003040321)
关键词 散热 LED GAN thermal design LED GaN
  • 相关文献

参考文献5

  • 1Regina M M, Gerd O M, Krames M R, et al. Highpower phosphor-converted light-emitting diodes based on Ⅲ-nitrides[J]. IEEE Journal on Selected Topics in Quantum Electronics, 2002, 8(2): 339-345.
  • 2Lee C. Temperature dependence of the radiative recombination zone in InGaN/GaN multiple quantum well light-emitting diodes[J]. J. Appl. Phys., 2002, 89(11):6 554-6 556.
  • 3Arik M, Weaver S. Chip scale thermal management of high brightness LED package[J]. Proc. SHE, 2004, 5 530: 214-223.
  • 4Kim L, Lee G W, Hwang W J, et al. Thermal analysis and design of GaN-based LEDs for high power applications[J]. Phys. State Sol. (C), 2003(7) : 2 261- 2 264.
  • 5Xi Y, Schubert E F. Junction temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method[J]. Appl. Phys. Lett. , 2004, 85(12): 2 163-2 165.

同被引文献90

引证文献11

二级引证文献81

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部