X射线荧光法检测纸张厚度

Measuring Thickness of Paper by XRF

利用同位素X射线源和高分辨率X射线探测器,分别应用特征荧光吸收法和反散射法对不同纸张样品厚度进行无损检测,结果表明:特征荧光吸收法的准确度和精密度分别优于4.7%和3.3%,反散射法的则分别优于6.3%和3.5%,两种方法的测量精度均可满足纸张厚度检测的需要;通过IED-2000P型XRF分析仪对纸张厚度的测量试验与研究,为下一步开展X荧光方法在线测试系统的研制提供参考。

By using isotope sources and high sensitive X-ray detector, the thickness of a number of paper samples were respectively scathelessly measured by the character X-ray absorption method and the backscattering method. The experiment indicated that the accuracy and precision of the charaeter X-ray absorption are respectively better than 4.7% and 3.3%,while the backscattering method are respectively better than 6.3% and 3.5%. Both methods have high accuracy and precision, and they can meet the requirements of the thickness measurement of paper. Based on the experiment and research to apply the IED-2OOOP type X-ray fluorescence analyzer to the measurement of the thickness of paper, it can supply references to design the online paper thickness measurement system which is based on XRF.