摘要
通过模拟实验制备铜导线短路熔珠样品,应用S-3400N扫描电镜观察其外观形态、微观形貌及显微组织.科学地分析了不同条件下形成的铜导线短路熔珠所具有的痕迹特征,并以此研究铜熔珠熔化性质、形成特点及机理.
The microstructure and morphological features of the copper wire melted bead samples in short circuit are observed by S-3400N SEM in simulation experiments. The trace features of copper wire melted beads are scientific analyzed in different conditions and the author provided a powerful reference in studying the melted features, formation characters and principles through trace and morphological features of copper melted beads.
出处
《沈阳工程学院学报（自然科学版）》
2007年第4期402-404,共3页
Journal of Shenyang Institute of Engineering:Natural Science
关键词
扫描电镜
短路
熔珠
SEM
short circuit
melted beads
