基于EBSD技术对NiW合金复合基带表面微取向的分析

Analysis of micro-orientations on the surface of NiW composite substrates using EBSD technique

采用EBSD技术对大冷轧变形量、再结晶退火后的Ni-W复合基带的表面织构进行了表征，对其晶粒取向信息、晶界特征等信息进行采集和分析。该基带经过冷轧和再结晶退火后，无需抛光，即可获得具有花样质量较高的Ni基复合基带表面的EBSD图像。经Orientation Imaging Microscopy^TM（OIM）4．6软件分析，结果表明该Ni基复合基带表面10°以内立方织构晶粒百分含量为97．9％。

In this work, the micro-orientation of the Ni5W surface layer on a NiW composite substrate that was processed by heavy cold roiling and recrystallization annealing, was analyzed by EBSD technique. The data such as misorientation angles, grain boundaries as well as no-cubic components was collected, while the results being calculated by OIM 4.6 software. The high EBSD image quality （IQ） was obtained in the sample surface after cold roiling and an annealing process without polishing. A sharp cube texture was formed on the surface of outer-layer of as-obtained NiW composite substrate. The percentage of the cube texture grains in the composite substrates was reached to 97.9% within a misorientation angle of 10° .