组合逻辑电路故障诊断研究

Research on Combination Logic Circuit Fault Diagnosis

论述了一种把各种逻辑电路转化为由与非门组成的电路，然后转变为双色图并直接获得完整的测试矢量或故障表的方法，该法可定位全部单故障及大部分多故障．

A method that converts all logic circuits into NAND gate,then into two color graph is described,which can directly abtain the complete test vector or fault table.Furthermore the method can locate all single faults and most of multiple faults. [