FPGA测试中故障屏蔽现象的分析和研究

Research on Fault Mask in the Test of FPGA

通过对基于SRAM结构的FPGA测试方法进行分析和研究,提出了FPGA测试中的故障屏蔽现象,并给出该现象的产生原因和判断条件,在此基础上,进一步提出相应的解决办法和建议,以避免或减少故障屏蔽现象的出现,提高测试FPGA的故障覆盖率.

Field Programmable Gate Arrays （FPGAs）are widely used in the hardware implementation of circuit design. Detecting the faults of FPGAs is very important. This paper presented the problem of fault mask in the test of FPGA, and focused its research on the generating reasons and conditions of fault mask. Finally, the solutions and suggestions are given to reduce its appearance and to improve the fault coverage of FPGA test.