摘要
用正电子寿命谱研究了La1.6-xNd0.4SrxCuO4(x=0.12,0.15,0.20)和La1.88Sr0.12CuO4,结果表明随着Sr掺杂量的增加,空穴载流子增加,而正电子寿命却减小,分析认为可能是正电子密度分布权重由CuO2面向Nd替代后的La(Nd,Sr)-O层转移的结果.并分析了体系的电子密度ne随Sr掺杂量的变化关系,表明随着Sr掺杂量的增加ne逐渐增大.但对同样Sr含量的La1.88Sr0.12CuO4和La1.48Nd0.4Sr0.12CuO4其ne基本相同,体现出Nd替代La对样品的载流子数目没有明显影响.
Positron lifetime spectroscopies were studied for La1.6-xNd0.4SrxCuO4 system （x=0. 12,0. 15,0. 20） and La1.88Sr0.12CuO4. Positron lifetime decreases with the increase of Sr doped content, which is perhaps that, the weight of positron density distribution turns from CuO2 plane before Nd doped to La（Nd,Sr）-O layer after Nd doped. Local electron density ne as a function of Sr doped content was studied and show ne increase with the increase of Sr doped content. But nc of La1.88Sr0.12CuO4 and La1.48 Nd0.4 Sr0.12 CuO4 at the same Sr doped content are mostly the same, which reveals that carrier density does not change while Nd substitute for La in La2-xSrxCuO4 system.
出处
《河南师范大学学报（自然科学版）》
CAS
CSCD
北大核心
2007年第4期58-61,共4页
Journal of Henan Normal University(Natural Science Edition)
基金
河南师范大学科研启动课题(522023)
关键词
正电子寿命
分布权重
局域电子密度
positron lifetime
the weight of positron density distribution
local electron density
