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Pb_xSr_(1-x)TiO_3陶瓷及薄膜的制备和性能研究

Preparation and Properties of Pb_xSr_(1-x)TiO_3 Ceramics and Thin Films
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摘要 研究了Pb的摩尔分数对PbxSr1-xTiO3(x=0.2~0.8)陶瓷微结构和介电性能的影响,当x〈0.45时晶体为立方相,x≥0.45时为四方相;随着Pb的摩尔分数增大,陶瓷气孔率下降,致密度增加,晶粒尺寸逐渐增大,居里峰近似线性地向高温方向移动,并具有一致的居里外斯常数。采用射频磁控溅射法在Pt/Ti/SiO2/Si(100)上制备了Pb0.3Sr0.7TiO3(PST30)薄膜,经550℃退火后为(111)择优取向的多晶薄膜,1kHz下的可调率为21.8%。 PbxSr1-xTiO3(x=0.2-0.8) ceramics are prepared, and the effect of the Pb content on the microstructure and dielectric properties are studied. X-ray diffraction studies show that the lattice structure changes from cubic to tetragonal phase at 45 % Pb content. Scanning Electron Microcopy studies indicate that the higher Pb content is, the greater grain size and the higher density is. εr-T curve exhibits that Curie-Temperature linearly increases with the increase of Pb content and the compositions (x = 0.20- 0.55 ) show the similar Curie-Wiess constant. Pb0.3Sr0.7TiO3 thin film are prepared by RF magnetron sputtering on Pt/Ti/SiO2/Si(100) substrate and annealed at 550 ℃. Meanwhile, the films exhibit (111) orientation and the tunability is measured to be 21.8% at 1 kHz.
出处 《压电与声光》 CSCD 北大核心 2007年第6期710-712,716,共4页 Piezoelectrics & Acoustooptics
基金 国家"九七三"基金资助项目(Z01)
关键词 PbxSr1-xTiO3陶瓷 射频磁控溅射 Pb0.3Sr0.7TiO3(PST30)薄膜 微结构 介电性能 PbxSr1-xTiO3 ceramics RF magnetron sputtering Pb0.3Sr0.7TiO3 thin film microstructure dielectric properties
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参考文献12

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