摘要
不同表面处理对碲镐汞测量会产生一定的影响。在抛光腐蚀和仅抛光两种工艺下对碲镉汞样品作椭偏测量，发现仅抛光样品的光谱特征表现出低的反射率和大的峰展宽，且峰向较低的能量方向移动，理论计算的能量移动与实验结果相符。
The measurements are performed on HgCdTe polished/etched and pol-ished-only samples to check the influence of surface preparation on HgCdTe. The spec-tral features of the polished-only surfaces show lower reflectivity and great broadening in addition to overall shifts to lower energies. The energy shift of theoretical calculation is in good agreement with the experimental result.
出处
《红外与激光工程》
EI
CSCD
1997年第4期39-40,共2页
Infrared and Laser Engineering
基金
山东省自然科学基金
青年基金
