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热处理工艺对锡须的形成与长大影响

Effect of Heat Treatment on the Formation and Growth of Tin Whisker
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摘要 用扫描电镜观察分析、研究了不同热处理工艺对共晶Sn-Cu电镀层上锡须的形成与生长影响。结果表明,高温高湿处理易促使锡须的形成与长大,经过一定的时间后,锡须生长速度减缓;循环热处理或室温处理对锡须的形成与长大影响较小;施加恒定拉力后进行室温处理,锡须的形成完全受到抑制,其形成与长大是由于电镀层中存在压应力,促使镀层中的锡再结晶并长大成锡须。 The effect of heat treatment on the formation and growth of tin whisker from eutectic Sn-Cu electroplated coating was investigated by use of scanning electron microscopy(SEM).It is shown that the unbiased temperature & humidity accelerates the formation and growth of tin whisker.However,thermal shock or ambient temperature storage do not obviously promote the formation and growth of tin whisker.When adding tensile stress in ambient temperature storage,the formation of tin whisker is completely inhibited.The compressive stress is necessary condition leading to recrystallization and tin whisker growth.
出处 《金属热处理》 EI CAS CSCD 北大核心 2007年第11期88-90,共3页 Heat Treatment of Metals
基金 国家重点基础研究项目(G2005CB623704) 中国博士后科学基金(20070410986)
关键词 电镀层 锡须 热处理 压应力 electroplated coating tin whisker heat treatment compressive stress
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参考文献10

  • 1Tu K N.Irreversible processes of spontaneous whisker growth in bimetallic Cu-Sn thin-film reactions[J].Phys.Rev.B,1994,49(3):2030-2034.
  • 2Lee B Z and Lee D N.Spontaneous growth mechanism of Tin whiskers[J].Acta Mater,1998,46(10):3701-3714.
  • 3Galyon G T.A history of Tin whisker theory:1946-2004[A].IBM eSG Group,SMTAI International Conference[C].Chicago,2004:26-30.
  • 4European Union(EU).Directive 2002/96/EC of the European Parliament and of the Council 27 January 2003 on Waste Electrical and Electronic Equipment(WEEE)[J].Official Journal of the European Union,2003,37:24-38.
  • 5Zeng K and Tu K N.Six cases of reliability study of Pb-free solders joints in electronic packing technology[J].Mater.Sci.Eng.R.,2002,R38:92-101.
  • 6Kadesch J S,Leidecker H.Effects of conformal coating on tin whisker growth[A].Proc 37th.IMAPS Nordic Annual Conference[C].Helsing r,2000:108.
  • 7Sriyarunya A,Tondtan J,Bansal D.Matte Tin(Sn)plating-whisker growth study[A].Proceedings of 6th Electronics Packaging Technology Conference[C].EPTC 2004,Proceedings of 6th Electronics Packaging Technology Conference,EPTC 2004:281.
  • 8Lal S,Moyer T D.Role of intrinsic stresses in the phenomena of tin whiskers in electrical connectors[J].IEEE Transactions on Electronics Packaging Manufacturing,2005,28(1):63-74.
  • 9Tu K N,Suh J O,Tamura N.Mechanism and prevention of spontaneous tin whisker growth[J].Materials Transactions,2005,46(11):2300-2308.
  • 10Zhao J H,Su P,Ding M,et al.Microstructure-based stress modeling of tin whisker growth[A].Proceedings-Electronic Components and Technology Conference[C].v1,2005 Proceedings-55th Electronic Components and Technology Conference,ECTC,2005:137.

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