提高钽电容器可靠性的一种新老化方法

Application of new aging method to improve reliability of tantalum capacitor

通过对钽电容器自愈机理的研究,针对传统老化方法不能彻底剔除电介质有缺陷的钽电容器的缺点,提出一种新的老化方法并对多种钽电容器进行老化实验。新方法可以有效识别并100%剔除电容器不良品,钽电容器生产率提高了50%,钽电容器失效率达到0.1%/(1 000 h),可靠性提高。经验证,这种新老化方法适用于固体电容器、片式钽电容器、聚合物钽电容器和液体钽电容器等多种元件的老化筛选。

Through study on self-healing mechanism in tantalum capacitor and for resolving problem that tantalum capacitor with defect dielectric can not be eliminated completely by using conventional aging method, a new aging method was proposed and tested on several categories of tantalum capacitor. As a result, defectives of tantalum capacitor can be recognized and rejected thoroughly, productivity of tantalum capacitor has increased by 50% and its reliability has reached up to 0.1%/（1 000 h）. It is proven through testing that this new aging method is suitable for many electronic components such as solid capacitor, tantalum chip capacitor, tantalum capacitor with polymer cathode and wet tantalum capacitor.