期刊文献+

并行测试系统资源配置模型 被引量:1

Research on Parallel ATS Resource Configuration Model
下载PDF
导出
摘要 并行测试是下一代自动测试技术的主要发展方向之一。从并行测试系统的本质概念入手,分析了影响并行测试系统资源优化配置的关键因素,给出了解决问题的思路。研究了并行测试信号模型、测试资源接口模型,以降低系统组建成本和提高测试系统效率为研究目标,提出了并行测试任务优化序列的概念;以此为基础,给出了并行测试资源优化配置方法。 Parallel Test is a main direction for the next generation Automatic Test System. The key factors that influence the parallel test system's resource configuration are analyzed based on the essence conception of Parallel Test. Then the means of resolving the complex problem of the parallel test is given. The signal model of unit under parallel test and the interface model of the test resource are studied. In order to reduce the parallel test system cost and improve the system efficiency, the conception of parallel test optimized task list is put forward. The method of parallel test system's resource configuration is presented based on the conception.
出处 《空军工程大学学报(自然科学版)》 CSCD 北大核心 2007年第6期48-51,共4页 Journal of Air Force Engineering University(Natural Science Edition)
基金 国防科技重点实验室基金资助项目(51487020305JB3201) 总装备部"十一五"国防预研基金资助项目(51317030103)
关键词 自动测试系统 并行测试 资源配置 automatic test system parallel test resource configuration model
  • 相关文献

参考文献4

二级参考文献20

  • 1Ross W A. The Impact of Next Generation Test Technology on Aviation Maintenance [A]. IEEE AUTOTESTCON [C]. 2003: 2-9.
  • 2Ross B. ARGCS Update [EB/OL]. http://proceedings.ndia.org / 311C / ,21 September, 2003.
  • 3Ross B. NxTest: DoD nest step in automatic testing [EB/OL]. http://www. acq.osd.mil, 10 March 1999.
  • 4Stora M J. Standard automatic test system (SATS) hardware interface standards for SATS frameworks, VXI instrument front panels, power module interface, augmentation module interface, receiver fixture interface, pin map configuration [A]. IEEE AUTOTESTCON [C]. 1998:627-638.
  • 5Stora M J. IEEE P1505 receiver fixture interface (RFI) system standard update 6.0 [A]. IEEE AUTOTESTCON [C]. 1999: 27-33.
  • 6Ramachandran N. Oblad R P. The role of a signal interface in supporting instrument interchangeability [A]. IEEE AUTOTESTCON [C]. 2000:403-416.
  • 7IEEE Std 1232-1995. IEEE Trial-Use Standard for Artificial Intelligence and Expert System Tie to Automatic Test equipment Overview and Architecture [S]. 1995.?A
  • 8Ross B. DoD Automatic Test Systems Strategy Refresh IEEE AUTO T ESTCON [C]. 2004.
  • 9IEEE Standard 1226-1998, IEEE Trial-Use Standard for A Broad Based Environment for Test, Overview and Architecture [S]. 1998.
  • 10Amanda Jane Giarla. Implementing AI-ESTATE in a component based architecture phase- Ⅰ [A]. IEEE AUTOTESTCON [C]. 1999: 438-449.

共引文献147

同被引文献21

  • 1IT168.IDF2011:英特尔硬件平台测试云-iLab[EB/OL].(2011-04-13)[2014-05-27].http://cloud.itl68.corn/a2011/0412/1176/000001176764.shtml.
  • 2HU Leigang, XIAO Mingqing. The Future of Auto- matic Test System (ATS) Brought by Cloud Compu- ting [C]// IEEE Autotesteon.California: IEEE press, 2009 : 412-414.
  • 3Reitze Dale D. Using Cloud Computing to Enhance Automatic Test Equipment Testing and Maintenance Capabilities [C]//IEEE Autotestcon . llinois: IEEE ptrdd, 2013 : 80-85.
  • 4Peter Mell, Timothy Grance. The NIST Definition of Cloud Computing[R]. USA: NIST Special Publica- tion 800-145, 2011:1-3..
  • 5IT168.云计算技术的产生、概念、原理、应用和前景[EB/OL].(2012-01-16)[2014-05-27].http://cloud.it168.com/a2012/0106/1299/000001299031.shtml.
  • 6SOASTA.Cloud Test Script Guide [M]. USA: SOAS- TA Inc, 2013 : 3-4.
  • 7Michael Armbrust, Armando Fox, Rean Griffith, etal.Above the Clouds:A Berkeley View of Cloud Com- puting [R]. Berkeley: Electrical Engineering and Computer Sciences University of California, UCB/ EECS-2009-28 : 1-6.
  • 8Mather Tim, Kumaraswamy Subra, Latif Shahed. Cloud Security and Privacy [ M]. USA: O' Reilly Media Inc, 2009:109-141.
  • 9王银坤,肖明清,王学奇.构件模型的测试系统演化开发波及效应分析[J].空军工程大学学报(自然科学版),2008,9(2):60-63. 被引量:2
  • 10黄艳敏.浅谈电子产品的硬件测试技术[J].单片机与嵌入式系统应用,2010,10(2):16-17. 被引量:16

引证文献1

二级引证文献11

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部