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同步辐射高分辨率衍射光束线的设计(英文)

Beam line design for high-resolution diffraction at synchrotron radiation sources
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摘要 介绍了第三代同步辐射高分辨率X射线衍射光束线的总体设计。给出了高分辨率衍射的基本原理并描述了获得确定光子能量的近平行高强度X射线光束线所必需的光学元件。特别是用X射线动力学理论,解释了双晶及四次反射晶体单色器。作为一个实例,介绍了将于2009年开始在德国汉堡运行的一个新的同步辐射源PETRAⅢ的高分辨率衍射( HighRes)光束线的设置情况。通过优化光学部件,对微米尺寸光束,q空间的分辨减小到Δq=10-5nm-1,光通量大于1011cts/s。 The general design of a high-resolution diffraeti'on beamline at a third generation X-ray synchrotron radiation source is presented. For this, we introduce the basics of high resolution diffraction and the optical elements necessary to prepare a nearly parallel but intense X-ray beam with well-defined photon energy for high-resolution application. In particular, the function of double-crystal and four-bounced crystal monochromators is explained in terms of X-ray dynamical theory. As an example, we present the layout of the High Resolution Diffraction (HighRes) beamline at the new synchrotron radiation source PETRA III in Hamburg (Germany) which will become operational in 2009. By optimizing the optical components, a resolution in q-space will be achieved down to △q= 10^-5 nm^-1 with micron beam size and a flux of more than 10^11 cts/s.
出处 《光学精密工程》 EI CAS CSCD 北大核心 2007年第12期1900-1907,共8页 Optics and Precision Engineering
关键词 同步辐射 衍射光束线 高分辨率 synchrotron radiation source diffraction beamline high resolution
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参考文献8

  • 1FRANZ H, LEUPOLD O, HLSBERGER R R,et al.. PETRA III: DESY's new high brilliance third generation synchrotron radiation source[J]. Synch. Rad. News, 2006,6:25-29.
  • 2BALEWSKI K, BREFELD W,DECKING W,et al. PETRA Ⅲ: A Low Emittance Synchrotron Radiation Source [M]. DESY Press,2004.
  • 3PARRATT I. G. Surface studies of solids by total reflection of X-rays[J]. Phys. Rev, 1954,95(2):359-369.
  • 4PINSKER Z G. Dynamical scattering of X-rays in crystals[J]. Springer, 1978.
  • 5DUMOND J W M. Theory of the use of more than two successive X-ray crystal reflections to obtain increased resolving power[J]. Phys. Rev , 1937,52 (8) : 872- 883.
  • 6BARTELS W J, Characterization of thin layers on perfect crystals with a multipurpose high resolution X-ray diffractometer[J]. J. Vac. Sci. Technol. , 1983, B1 : 338-345.
  • 7PIETSCH U, HOLY V,BAUMBACH T. High-resolution X-ray scattering from thin films and lateral nanostruc-tures[J]. Springer, 2004.
  • 8BUNK O. High resolution X-ray diffraction beamline[P]. PETRA Ⅲ Technical Design Report ,2003.

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