摘要
阐述了ICP-AES专家系统中AES电离和激发模型的基本原理,研究了模拟中应用non-LTE理论的正确性以及所需的支持数据库。利用 Boltzmnann曲线,讨论了 Boltzmann温度的测量值随能级激发能而变化的现象,并与类似条件下的实验Boltzmann曲线进行了对比,证明了专家系统中AES电离和激发模型的可靠性。
The fundamental principle of atbmic ionization and excitation models applied in ICP-AES primary expert system was described. The validity of non--LTE processes and nec- essary databases was demonstrated. Boltzmann plots of Ca and Mg with non-LTE simulation showed that the Boltzmann temperature might not be represented with only one value. The reliability of the established AES excitation model has been proved by the comparison with experimental Boltzmann plots.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1997年第8期869-873,共5页
Chinese Journal of Analytical Chemistry
基金
国家自然科学基金
关键词
原子发射光谱
专家系统
激发机理
ICP
AES
Inductively coupled plasma-atomic emission spectrometry, expert system, exci- tation mechanism, boltzmann plot (Receivcd l4 November l996
accepted 24 April l997)