X波段固态功率放大器稳定性分析设计

Stability Analysis and Design of X-band Solid-state Power Amplifier

X波段固态功率放大器相对于较低频段的固态功率放大器,其稳定性问题更加突出。腔体效应是导致稳定性问题的重要因素,通过对腔体效应的理论分析,文中提出了工程应用中解决因腔体效应导致的稳定性问题的可行方法,成功地解决了X波段固态功率放大器设计过程中遇到的腔体效应问题。

Stability problem in X-band solid-state power amplifier is rather evident than other lower frequency solid-state power amplifier. Cavity effect is the main factor that results in stability problem. In this paper, engineering practicable methods solving stability problem results from cavity effect are proposed after theory analysis of cavity effect, and the cavity effect problem in X-band solid-state power amplifier design is successfully resolved.