RF ID智能卡可靠性预计模型的研究

Study on Reliability Prediction Model of RF ID Smart Card

通过对集成电路可靠性预计模型的理论和RF ID智能卡结构的研究,结合MIL-HDBK-217F,建立了RF ID智能卡可靠性预计模型,使RF ID智能卡研制进程有定量分析结果作为依据,避免了因缺乏实现可靠性、维修性指标所必须采取的技术措施,或因所采取的措施带有很大的盲目性而造成经济上和时间进度上的重大损失。

A reliability prediction model of RF ID smart card was proposed based on the study of the reliability prediction model of integrated circuits and the structure of RF ID smart card, with reference to MIL-HDBK-217F. The proposed model provided quantitative analysis result for development process of RF ID smart cards, so that necessary measures reliability and maintainability could be taken when needed, greatly reducing both time and cost.