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Traceable long range scanning tunneling microscopy

Traceable long range scanning tunneling microscopy
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摘要 Dimensionally correct and directly traceable measurement is not feasible with conventional scanning tunneling microscopy (STMs) due to severe hysteresis and non-linearity of the commonly applied piezo tube scanners and the very short range. By integrating a custom made probing system based on tunneling current measurement into a commercially available and laser-interferometrically position controlled positioning system, an STM with a principal measuring Dimensionally correct and directly traceable measurement is not feasible with conventional scanning tunneling microscopy (STMs) due to severe hysteresis and non-linearity of the commonly applied piezo tube scanners and the very short range. By integrating a custom made probing system based on tunneling current measurement into a commercially available and laser-interferometrically position controlled positioning system, an STM with a principal measuring range of 25 mm × 25 mm× 5 mm and traceable position measurement has been set-up and tested.
出处 《Optoelectronics Letters》 EI 2008年第1期49-50,共2页 光电子快报(英文版)
基金 Antrag GZ 398, Chinesisch-Deutsches Zentrum für Wissenschaftsfrderung,2006.
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参考文献5

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