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改进型FDR码对SoC测试数据的压缩及解压缩 被引量：1

SoC test data compression and decompression with improved FDR code
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摘要 针对SoC测试中的关键问题——测试数据的压缩,提出了一种改进型的FDR码编码方法,称为IFDR码。它将测试序列看做连续的0串和1串,从而用同一种编码方法同时对0游程和1游程进行编码,突破了FDR码仅能对0游程进行编码的限制。通过分析可知IFDR码的解压电路的结构较简单,所需要的额外硬件开销很小;对ISCAS 89标准电路的实验结果表明,与FDR码以及同类型的其他编码方法相比,该编码方法能获得更高的压缩率,从而可以更好地节省测试数据的存储空间和测试应用时间。 To reduce the volume of SoC test data, an improved FDR code was proposed, called IFDR code. Unlike FDR code, it encoded both runs of 0s and Is with same codes, considering test sequences as distributions of 0 string and 1 string. Due to its simple architecture, the decompression circuit for IFDR code needed very little additional hardware. Experimental results for the ISCAS 89 benchmark circuits show that IFDR code outperforms FDR code and other similar codes in achieving higher compression ratio.
作者 欧阳一鸣 郭文鹏 梁华国
机构地区 合肥工业大学计算机与信息学院
出处 《计算机应用研究》 CSCD 北大核心 2008年第1期174-177,共4页 Application Research of Computers
基金 国家自然科学基金重大研究计划资助项目(90407008) 教育部留学回国人员科研基金资助项目(2004.527) 安徽省自然科学基金资助项目(050420103)
关键词 测试源划分 压缩/解压缩 FDR码 系统级芯片 test resource partitioning （TRP） compression/decompression FDR code system-on-a-chip （ SoC ）
分类号 TP302 [自动化与计算机技术—计算机系统结构]
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参考文献8

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二级参考文献15

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共引文献71

同被引文献9

  • 1TOUBA N. Survey of test vector compression technique [J]. IEEE Design Test of Computer, 2006,23(4) :294-303.
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  • 3JAS A, GOSH-DASTIDAR J, NG M, et al. An efficient test vector compression scheme using selective Huffman eoding[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2003, 22(6):797-806.
  • 4CHANDRA A, CHAKRABARTY K. Test data compression and decompression based on internal scan chains and Golomb eoding[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2002,21(6) :715-722.
  • 5CHANDRA A, CHAKRABARTY K. System-on-a-chip test- data compression and decompression architectures based on Golomh codes[J]. IEEE Transactions on Computer Aided De- sign of Integrated Circuits and Systems, 2001, 20 (3) : 355 - 368.
  • 6CHANDRA A, CHAKRABARTY K. Frequency-directed run-length(FDR) codes with application to system-on-a-chip test data compression[C]//19th IEEE Proceedings on VLSI Test Symposium. New York: IEEE, 2001 : 42-47.
  • 7EL-MALEH A, AL-ABAJI R. Extended frequency-directed run-length codes with improved application to system-on-a-chip test data eompression ECT//Proeeedings of 9th International Conference of Electronics, Circuits and Systems. New York: IEEE, 2002: 449-452.
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  • 9ZHAN W F, EL-MALEH A. A new scheme of test data com- pression based on equal-run-length coding (ERLC)[J]. Inte- gration the VLSI Journal , 2012, 45(1): 91-98.

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计算机应用研究
2008年 第1期

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