可控温双向反射分布函数测量系统的研制

Development of a Temperature Controllable BRDF Measurement System

基于单一参考测量法的测量原理,研制了一套测量温度最高可达500℃的多光谱双向反射分布函数测量系统。光源采用从可见光的0.6328μm到中远红外的10.6μm波长的激光器,针对不同波长的激光器选择相应的光电探测器,利用转角装置来实现光源、探测器和试样相对位置的变化,通过加热炉对试样进行加热,采用模糊PID控制器进行温度的控制,控制精度为±1℃。在可见光和红外波段下,利用标准白板对测量系统进行实验误差标定,通过对实验数据进行分析,测量误差小于15%。该装置可应用于不同温度下材料表面空间反射特性的测量。

Based on the BRDF single reference measurement principle, a BRDF measurement system was developed with the measure temperature at 500℃ maximum. The light source is the laser organ whose wavelength is from visible light 0.63280an to far-middle infrared light 10.6μm. According to the different wavelengths of laser organ, photoelectric detectors were chosen accordingly. The relative position transfer of the light source, detector and sample was realized by the turntable device. The sample was heated by the heating-furnace and the temperature was controlled by fuzzy PID controller with the accuracy at ±1℃. Under visible light and infrared wavelengths ,the measurement system was calibrated by utilizing the standard white board. With the analysis of the experiment results, the error is less than 15%. This device is applicable to the measurement of material surface space reflectance property under different temperatures.