期刊文献+

基于采样定理的白光干涉SEST算法研究

White-light interferometric SEST algorithm based on sampling theory
下载PDF
导出
摘要 研究了基于采样定理的白光干涉测量算法——Square-envelop function Estimation by Sampling Theory(SEST)算法,该算法采样间隔是传统算法的数倍,最大可达1.425"m,大大提高了测量速度。在该算法基础上,提出应用循环缓冲器来定位相干区间,减少了存储的采样值及计算量,提高了数据处理速度。仿真结果表明,该算法是快速、有效的。 An white-light interferometric algorithm,Square-envelop function Estimation by Sampling Theory (SEST) algorithm, based on sampling theory is introduced.The algorithm extends the sampling interval to 1.425 μm,which is several times wider than those used in conventional algorithm.On the basis of the algorithm,a circular buffer is proposed to locate the interference region in order to reduce the sampling data and the computational cost then increase the data processing speed.Simulation results show that the algorithm is fast and effective.
出处 《计算机工程与应用》 CSCD 北大核心 2008年第1期79-81,共3页 Computer Engineering and Applications
基金 国家重点基础研究发展规划(973)(the National Grand Fundamental Research973Program of China under Grant No.2003CB716207) 国家自然科学基金(the National Natural Science Foundation of China under Grant No.50405033) 国家高技术研究发展计划(863)(the Na-tional High-Tech Research and Development Plan of China under Grant No.20060104Z3055)。
关键词 光学测量 SEST算法 白光干涉 表面形貌 optical measurement SEST algorithm white-light interference surface profile
  • 相关文献

参考文献8

  • 1Balasubramanian N.Optical system for surface topography measurement.U.S.Patent,4340306,1980.
  • 2杨天博,郭宏,李达成.白光扫描干涉测量算法综述[J].光学技术,2006,32(1):115-117. 被引量:21
  • 3Kino G S,Chim S S C.Mirau correlation microscope[J].App Opt,1990,29(26):3775-3783.
  • 4de Groot P,Deck L.Surface profiling by analysis of white light interferograms in the spatial frequency domain[J].Journal of Modern Optics,1995,42(2):389-401.
  • 5Hirabayashi A,Ogawa H,Kitagawa K.Fast surface profiler by whitelight interferometry by use of a new algorithm based on sampling theory[J].App Opt,2002,41 (23):4876-4883.
  • 6Chen Laing-Chia,Fan Kuang-Chao,Lin Chi-Duen,et al.3-D surface profilometry for both static and dynamic nano-scale full field characterization of AFM micro cantilever beams[C]//Proc of SPIE,2005,5878(4):1-12.
  • 7Ogawa H,Hirabayashi A.Sampling theory in white-light interferometry[J].Sampling Theory in Signal and Image Processing,2002,1(2):87-116.
  • 8Deck L,de Groot P.High-speed noncontact profiler based on scanning white-light interferometry[J].App Opt,1994,33 (31):7334-7338.

二级参考文献12

  • 1Chen S,Palmer A W,Grattan K T V,et al.Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry[J].Appt Opt,1992,31:6003-6010.
  • 2Larkin K.Efficient nonlinear algorithm for envelope detection in white light interferometry[J].J Opt Soc Am A,1996,13(4):832-843.
  • 3Sandoz P.Unambiguous profilometry by fringe order identification in white-light phase-shifting interferometry[J].J Mod Opt,1997,44:519-534.
  • 4Hariharan P,Oreb B F,Eiju T.Digital phase shifting interferometry:a simple error compensating phase calculation algorithm[J].Appl Opt,1987,26:2504-2505.
  • 5Stanley S,Chim C,Kino G S.Three-dimensional image realization in interference microscopy[J].Appl Opt,1992,31:2550-2553.
  • 6Kino G S.Mirau correlation microscope[J].Appl Opt,1990,29:3775-3783.
  • 7Recknagel R J.Analysis of white light interferograms using wavelet methods[J].Optics Communications,1998,148:122-128.
  • 8Danielson B L.Absolute optical ranging using low coherence interferometry[J].Appl Opt,1991,30:2975-2979.
  • 9de Groot P,Deck L.Surface profiling by analysis of white-light interferograms in the spatial frequency domain[J].J Mod Opt,1995,42:389-401.
  • 10de Groot P,et al.Determination of fringe order in white-light interference microscopy[J].Appl Opt,2002,41:4571-4578.

共引文献20

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部