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RC5到RC6的演化设计 被引量：1

Evolution Design from RC5 to RC6
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摘要 对RC5和RC6进行详细的比较和分析,讨论从RC5到RC6的演化设计过程,在此基础上,通过算法仿真实验,给出各自在性能上的优缺点。 The paper has described and compared RC5 and RC6 and analyzed the process of evolution design from RC5 to RC6. Based on simulation test, the paper pointed the difference between RC5 and RC6 on performance
作者 张娅莉 黄德成
机构地区 信阳职业技术学院数学与计算机科学系
出处 《荆门职业技术学院学报》 2007年第12期27-30,34,共5页 Journal of Jingmen Technical College
关键词 RC5 RC6 演化设计 仿真实验 RC5 RC6 evolution design simulation test
分类号 O29 [理学—应用数学]
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参考文献7

  • 1WEEKS B. ,BEAN M. ,ROZYLOWICZ T,et al. Hardware Performance Simulations of Round 2 Advanced Encryption Standard Algorithms [ C ]//Proceedings of 3 rd AES Conference. New York:National Institute of Standards and Technology,2000:286 - 304.
  • 2WOLLINGER T. , WANG M. , GUAJARDO J, et al. How well are High - end DSPs Suited for the AES Algorithms [ C ]//Proceedings of 3rd AES Conference. New York:National Institute of Standards and Technology,2000:94 -105.
  • 3ELBIRT A. , YIP W. , CHETWYND B, et al. An FPGA Implementation and Performance Evaluation of the AES Block Cipher Candidate Algorithm Finalists [ C ]//Proceedings of 3rd AES Conference. New York: National Institute of Standarch and Teehnology,2000:13 - 27.
  • 4GAJ K,CHODOWIEC P.. Comparison of the Hardware Performance of the AES Candidates using Reconflgurable Hardware[ C ]//Proceedings of 3rd AES Conference. NewYork: National Institute of Standards and Technology,2000:40- 54.
  • 5NECHVATAL J. , BARKER E. , BASSHAM L, et al. Report on the Development of the Advanced Enerypfion Standard (AES) [ C ]//Proceedings of 3rd AES Conference. NewYork : National Institute of Standards and Technology,2000 : 1 - 8.
  • 6HACHEZ G. , KOEUNE F. , QUISQUATER J. J. CAESar Results: Implementation of Four AES Candidates on Two Smart Cards[ C ]//Proceedings of 2nd AES Candidate Conference. Rome:National Institute of Standards and Technology, 1999:95 - 108.
  • 7DRAY J. Report on the NIST Java AES Candidate Algorithm Analysis[C]//Proceedings of 3rd AES Conference. New York: National Institute of Standards and Technology,2000:149 -160.

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荆门职业技术学院学报
2007年 第12期

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