摘要
介绍了半导体老化测试生产流程。针对老化测试作业排序问题的固有复杂性和目标函数难以求解等特点,建立了基于"Arena"建模软件的仿真和优化的集成系统框架。在该框架下可引入各种随机因素提高对实际系统的建模与求解能力。系统运行结果表明:当自动装载芯片设备(ALU)、老化测试设备(MTX)、装载芯片线路板(CB)的数量比为2:2:2时,有最大产量和最短等待时间,它是生产一个批量的最优化方案。
This introduces the manufacturing process of bum-in testing in semiconductor field. With consideration of lot queuing complex issue and the difficulty of definite function setup. To build up the model of simulation named as Arena and optimized system framework, this system will input dynamic discrete event as practical process and figure out the different result when different scenarios. The result indicates that there＇ll be maximum output and shortest queuing time when the quantity ratio of ALU/MTX/CB is 2 to 2 to 2, so that should be the best solution for this simulation model.
关键词
半导体
老化测试
优化
semiconductor
burn-in testing
optimize.
