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双沟道实空间电子转移晶体管的设计、研制和特性测量

Design,Fabrication,and Characterization of Dual Channel Real Space Transfer Transistors
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摘要 采用双沟道结构和GaAs衬底,成功设计研制了双沟道实空间电子转移晶体管.它具有RSTT典型的"Λ"形负阻I-V特性和较宽的平坦谷值区.通过栅压可改变各种负阻参数值,当栅压从0.6V增至1.0V时,PVCR的变化范围是2.1~10.6,峰值电流跨导约为3×10-4S.负阻参数VP,VV和开始产生负阻的栅极阈值电压都小于国际上同类器件的报道值,因此更适合低功耗的运用. By adopting a dual channel structure and a GaAs substrate,a real space transfer transistor is successfully designed and fabri- cated. It has the standard “A” shaped negative resistance I-V characteristics as well as the level and smooth valley region of a conventional RSTT. The negative resistance parameters can be varied by changing the gate voltage. For example, the PVCR varies from 2. 1 to 10. 6V while Vos changes from 0.6 to 1.0V. The transconductance for Ip (AIp/A VGs) is 0.3mS. The parameters Vp and Vv ,and the threshold gate voltage for negative resistance characteristics are smaller than the values reported in the literatures. This device is suitable for low dissipation power application.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第1期136-139,共4页 半导体学报(英文版)
基金 国家重点基础研究发展规划资助项目(批准号:2002CB311905)~~
关键词 RSTT 高速化合物三端功能器件 三端负阻器件 热电子器件 电子转移器件 RSTT high speed compound three terminal function device three terminal negative resistance device hot electron device electron transfer device
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参考文献7

  • 1Luryi S, Gossard A K A C, Hendel R H. Charge injection transistor based on real-space hot-electron transfer. IEEE Trans Electron Device,1984,31(6) :832.
  • 2Grinberg A A,Kastalsky A, Luryi S. Theory of hot-electron injection:CHINT/NERFET devices. IEEE Trans Electron Devices, 1987,34(2) :409.
  • 3Wu C L,Hsu W C. Enhanced resonant tunneling real-space transfer in δ-doping GaAs/InGaAs gated dual-channel transistors grown by MOCVD. IEEE Trans Electron Devices, 1996,43 (2) 207.
  • 4Chen Y W,Hsu W C,Shieh H M,et al. High breakdown characteristic S-doping InGaP/InGaAs/AIGaAs tunneling real space transfer HEMT. IEEE Trans Electron Devices, 2002,49 (2) : 221.
  • 5李桂荣,郑厚植,李月霞,郭纯英,李承芳,张鹏华,杨小平.异质结电荷注入晶体管[J].Journal of Semiconductors,1996,17(3):203-206. 被引量:1
  • 6Sze S M. Physics of semiconductor devices. A Wiley-Interscience Pu blica tion, 1985: 613.
  • 7Wei H C, Wang Y H, Houng M P. N-shaped negative differential resistance in transistor structure with a resistive gate. IEEE Trans Electron Devices, 1994,41(8) :1327.

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