摘要
提出一种新的方法用于高精度数据采集片上系统的动态性能测试。该方法利用高维空间几何矢量投影的思想,将正弦响应信号向由其各次谐波组成的正交基投影来拟合测试数据,以残差的负熵作为拟合结束的判据,使残差最大限度接近白噪声,避免了传统以残差最小为判据的过拟合问题。实验证明了该方法的有效性。
A new method is proposed to test the dynamic performance of the high-resolution data acquisition system on chip, The method is based on the thought of the geometric projection in the high dimension space, The test data are approached by projecting them onto several orthonormal harmonic basis vectors. The objective function of the method is the negentropy of the residue in order to make it approach to the white noise, It can avoid the overfitting problem caused by using the least mean square of the residue as the objective function. The validity of the method is verified by the experiment results.
出处
《电子技术应用》
北大核心
2008年第1期111-113,共3页
Application of Electronic Technique
基金
国家自然科学基金资助(60576033)
863资助项目(2006AA01Z106)
关键词
高维空间投影
负熵
白噪声
动态性能
projection in the high dimension space
negentropy
white noise
dynamic performance
