多元红外探测器综合性能参数自动测试系统

Automatic Testing System for Comprehensive Parameters of Multi-node Infrared Detector

针对多元红外探测器过程质量控制和批量检测需求,研究开发了一套多元红外探测器综合性能参数自动测试系统,系统整体噪声水平<2 mV,通道增益一致性优于1.60%,实现了动态阻抗、探测率、电压/电流响应率、Ⅰ-Ⅴ曲线、启动时间、续冷时间、元间均匀性等参数的全自动测试。针对某型号探测器的测量实验表明,该测试系统具有较好的测量精度和稳定性。

To realize process quality control and batch test for multipixel infrared detector, an automatic comprehensive parameters test system is developed, which reaches the level that the system noise is less than 2 mV and the channel gain is better than 1.60%. The system can automatically test the parameters such as dynamic resistant, test ratio, voltage/current responsibility, start time, cooling time, I-V curve, pixel-to-pixel uniformity and so on. The experiment on some real infrared detector shows that the system has good measurement accuracy and repeatability.