摘要
采用X荧光压片法分析硅铁样品的方法,以一批硅铁标样和内控标样建立硅铁多元素分析曲线,以二次曲线方法应用于硅铁多元素的测定,取得满意的效果。
The fluorescence X-ray film-pressing method is adopted to analyze the silico- ferritesample. In so doing a lot of silicoferrite specimens arid intracavity specimens are used to establish a multi- element analysis curve of the silicoferrite in order to apply the secondary analysis method in the measurement of the mulit-element of the silicoferrite. Very satisfactory results have already been achieved by the method.
出处
《武钢技术》
CAS
2007年第6期21-23,共3页
Wisco Technology
关键词
X射线荧光分析
压片法
硅铁
fluorescence X-ray analysis
film-pressing method
silicoferrite
