摘要
采用氢氟酸(HF)蚀刻方法制备亚微米结构的锥形光纤,考察了不同HF浓度和蚀刻时间对亚微米光纤几何构型的影响,用SEM表征光纤的几何形状。实验表明,当HF:H2O=1:1、蚀刻时间约为5h时,得到了亚微米锥形光纤,且其表面光滑。亚微米锥形光纤在甲基三氯硅烷混合溶液中进行硅烷化反应后,与吖啶橙相互作用,用其尖端的荧光强度的变化来表征亚微米光纤尖端活性基团的键合程度。该方法可用于检测光纤尖端键合的活性基团,也可以检测耦合的靶分子,这为纳米光纤生物传感器的研制奠定了基础。
Sub-micron tapered fiber-optic was etched with hydrofluoric acid and characterized by scanning electron microscope. The concentration of HF and etching time were investigated to observe the change of geometry configuration of fibers-optic. The results showed the ratio of hydrofluoric acid and water of 1 : 1 and etching time of 5h are appropriate, fibers-optic obtained was of the scale of sub-micron structure and it's surface was smoothness so that they had a good optical performance. Consequently, silanization of fibers-optic was carried out in the solution of methyhrichlorosilane and Cyclohexane in order to bond reactive group on the end of sub-micron tapered fibers-optic, then it reacted with Acridine Orange (AO), and the intensity of fluorescence was detected with Flnoroskan Ascent to characterize the bond of reactive groups. The results showed that the method of fluorescence analysis established can be used to detect the bond of reactive groups after silanization, and it can be used to detect the bond of targeted molecules with silanized submicron tapered fibersoptic, too.
出处
《化学通报》
CAS
CSCD
北大核心
2008年第1期71-74,共4页
Chemistry
基金
四川省重点科技攻关项目(2006z02-0101-2)资助
关键词
化学蚀刻
锥形光纤
SEM
硅烷化
荧光强度
Chemical etching, Tapered fibers-optic, SEM, Silanization, Intensity of fluorescence