摘要
本文分析了固定故障所反映出的状态变换特征，提出状态变换故障模型。基于无复位时序电路，详细研究了有复位状态的同步电路测试生成问题及在无复位电路中的应用。
Based on the character of stuck up fault,this paper describes state transition testing algorithm.This approach involves state transition fault model and collapsing of fault set.In order to test the circuits that has not any reset state,special way for resolving start state is described.Finally.heuristic information that used testing process are proposed
出处
《计算机辅助设计与图形学学报》
EI
CSCD
北大核心
1997年第2期175-181,共7页
Journal of Computer-Aided Design & Computer Graphics
关键词
同步时序电路
测试
逻辑电路
state transition graph,test generation,collapse,state sequence.
