Au/a-Ge双层膜分形晶化及其V-I非线性研究

Study of Nonlinear V I Characteristic of Fractal Crystallization in Au/a Ge Bilayer Film

本文报道了Ａｕ／ａＧｅ双层膜的分形晶化现象，测量了Ａｕ／ａＧｅ双层膜在分形晶化后的ＶＩ特性。实验结果表明：分形晶化后的Ａｕ／ａＧｅ双层膜具有反常的非线性ＶＩ特征。

The fractal crystallization phenomenon of the Au/a Ge bilayer film has been investigated, and the V I characteristic for the film have been measured for the first time. The experimental evidence suggest that Au/a Ge film after fractal crystallization have nonlinear V I characteristic. The phenomenon was explained by the Random Tunneling Junction Network model (RTJN model).