摘要
研制了用于扫描近场光学显微镜的新型有源光纤探针,采用熔拉法和腐蚀法相结合,制作出掺Er3+光纤探针,实验测试了这种光纤探针的放大的自发辐射。该探针可提高系统的灵敏度,降低图像的相干噪声。
A new active fiber probe used for scanning near field optical microscope(SNOM) is successfully fabricated.In combination of fused pulling with chemical etching,an Er 3+ doped fiber probe is produced,whose amplified spontaneous emission is tested experimentally.This kind of probe may be used to improve the sensitivity of SNOM system,and to reduce the coherent noise of image.
出处
《半导体光电》
EI
CAS
CSCD
北大核心
1997年第4期250-252,265,共4页
Semiconductor Optoelectronics
基金
国家自然科学基金
关键词
探针
近场光学
有源光纤探针
显微镜
Er 3+ doped Fiber,Probe,Amplified Spontaneous Emission,Near field Optics