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基于PTIDR编码的测试数据压缩算法 被引量：2

A Test Set Compression Algorithm Based on PTIDR Code
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摘要 为减少测试数据存储量,提出一种有效的新型测试数据压缩编码--PTIDR编码,并构建了基于该编码的压缩/解压缩方案.PTIDR编码能够取得比FDR,EFDR,Alternating FDR等编码更高的压缩率,其解码器也较简单、易实现,且能有效地降低硬件开销.与Selective Huff man,CDCR编码相比,PTIDR编码能够得到较高的压缩率面积开销比.特别地,在差分测试集中0的概率满足p≥0.7610时,PTIDR编码能取得比FDR编码更高的压缩率,从而降低芯片测试成本. We present a new test data compression and decompression architecture based on a novel and efficient code, named PTIDR code. The proposed approach can acquire better compression efficiency than that of FDR （frequency-directed run-length）, EFDR （extended FDR）, alternating FDR etc. The decoder of PTIDR is also simpler, easier to realize and needs less hardware consumption. Compared with algorithms such as selective Huffman and CDCR （combining dictionary coding and LFSR reseeding）, PTIDR can acquire higher CR/AR （ratio of compression ratio and area ratio）. Especially, when the probability of 0s in the difference test set is greater than or equal to 0.7610, it can acquire better compression efficiency than FDR code, and thus, reducing the test cost of the chip.
作者 李国亮 冯建华 崔小乐
机构地区 北京大学信息科学技术学院 北京大学深圳研究生院信息工程学院
出处 《计算机辅助设计与图形学学报》 EI CSCD 北大核心 2008年第2期161-166,共6页 Journal of Computer-Aided Design & Computer Graphics
基金 国家自然科学基金(90207018,60576030)
关键词 测试数据压缩 哈夫曼编码 FDR编码 PTIDR编码 test data compression Huffman code FDR code PTIDR code
分类号 TN47 [电子电信—微电子学与固体电子学]
  • 相关文献

参考文献13

  • 1Jas A, Ghosh-Dastidar J, Touba N A. Scan vector compression/ decompression using statistical coding [C] //Proceedings of the 17th IEEE VLSI Test Symposium, Dana Point, California, 1999:114-120
  • 2Jas A, Ghosh-Dastidar J, Ng M E, et al. An efficient test vector compression scheme using selective Huffman coding [J]. IEEE Transitions on Computer-Aided Design of Integrated Circuits and Systems, 2003, 22(6) : 797-806
  • 3Chandra A, Chakrabarty K. System-on-a-chip test-data compression and decompression architectures based on Golomb codes [J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2001, 20(3) : 355-368
  • 4Chandra A, Chakrabarty K. Frequency-directed run-length (FDR) codes with application to system-on-a-chip test data compression [C] //Proceedings of the 20th IEEE VLSI Test Symposium, Marina Del Rey, California, 2001:42-47
  • 5El-Maleh A H, Al-Abaji R H. Extended frequency-directed runlength code with improved application to system-on-a-chip test data compression [C] //Proceedings of the 9th International Conference on Electronics, Circuits and Systems, Dubrovnik, 2002 : 449-452
  • 6Chandra A, Chakrabarty K. Reduction of SoC test data volume, scan power and testing time using alternating run-length codes [C] //Proceedings of IEEE/ACM, Design Automation Conference, New Orleans, Louisiana, 2002:673-678
  • 7韩银和,李晓维,徐勇军,李华伟.应用Variable-Tail编码压缩的测试资源划分方法[J].电子学报,2004,32(8):1346-1350. 被引量：26
  • 8方建平,郝跃,刘红侠,李康.应用混合游程编码的SOC测试数据压缩方法[J].电子学报,2005,33(11):1973-1977. 被引量：20
  • 9方建平,郝跃.一种有效的片上系统测试数据压缩算法[J].西安电子科技大学学报,2006,33(1):1-4. 被引量：7
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二级参考文献21

  • 1韩银和,李晓维,徐勇军,李华伟.应用Variable-Tail编码压缩的测试资源划分方法[J].电子学报,2004,32(8):1346-1350. 被引量：26
  • 2A Jas,J Ghosh-Dastidar,N A Touba.Scan vector compression/decompression using statistical coding[A].Proceeding of 17th IEEE VLSI Test Symposium[C].Dana Point,California,USA,1999.114-120.
  • 3A Chandra,K Chakrabarty.System-on-a-Chip test data compression and decompression architectures based on Golomb codes[J].IEEE Trans.on CAD of Integrated Circuits and System,2001,20(3):355-368.
  • 4A Chandra,K Chakrabarty.Frequency-directed run length (FDR) codes with application to system-on-a-chip test data compression[A].Proceeding of 20th IEEE VLSI Test Symposium[C].Marina Del Rey,California,USA,2001.42-47.
  • 5A Chandra,K Chakrabarty.Reduction of SOC test data volume,scan power and testing time using alternating run-length codes[A].Proceeding of IEEE/ACM,Design Automation Conference[C].New Orleans,Louisiana,USA,2002.673-678.
  • 6A Chandra,K Chakrabarty.How effective are compression codes for reducing test data volume[A]?Proceeding of VLSI Test Symposium[C].Monterey,California,USA,2002.91-96.
  • 7L Li,K Chakrabarty.Test data compression using dictionaries and fixed-length indices[A].Proceeding of IEEE VLSI Test Symposium[C].Napa Valley,California,USA,2003.219-224.
  • 8Yinhe Han,Yongjun Xu,Xiaowei Li.Co-optimization for test data compression and testing power based On variable-tail code[A].Proceeding of 5th International Conference on ASIC[C].Beijing,P R China,2003.105-108.
  • 9Yinhe Han,Yongjun Xu,Huawei Li,Xiaowei Li,A.Chandra.test resource partitioning based on efficient response compaction for test time and tester channels reduction [A].Proceeding of Asian Test Symposium[C].Xi'an,ShanXi,P R China,2003.440-445.
  • 10K Miyase,S Kajihara,I Pomeranz,M Reddy.Don't-care identification on specific bits of test patterns[A].Proceeding of International Conference on Computer Design[C].Freiburg,im Breisgau,Germany,2002.194-199.

共引文献39

同被引文献21

  • 1韩银和,李晓维,徐勇军,李华伟.应用Variable-Tail编码压缩的测试资源划分方法[J].电子学报,2004,32(8):1346-1350. 被引量：26
  • 2方建平,郝跃,刘红侠,李康.应用混合游程编码的SOC测试数据压缩方法[J].电子学报,2005,33(11):1973-1977. 被引量：20
  • 3彭喜元,俞洋.基于变游程编码的测试数据压缩算法[J].电子学报,2007,35(2):197-201. 被引量：32
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  • 5HELLEBRAND S,TARNICK S,RAJSKI J, et al. Generation of vector patterns through reseeding of multiple- polynomial linear feedback shift register [C]// Proceedings of International Test Conference. Baltimore, MD : IEEE ,1992:120 - 129.
  • 6KRISHNA C V,JAS A,TOUBA N A . Test vector encoding using partial LFSR reseeding [C]// Proceedings of International Test Conference. Baltimore, MD: IEEE, 2001:885 - 893.
  • 7JAS A,DASTIDAR J G, TOUBA N A . Scan vector compression/decompression using statistical coding [C]// Proceedings of the 17th IEEE VLSI Test Symposium . Dana Point, California: IEEE ,1999:114 - 120.
  • 8CHANDRA A, CHAKRABARTY K . System-on-a- Chip test data compression and decompression architectures based on Golomb codes[J]. IEEE Transactions on CAD of Integrated Circuits and System, 2001,20 ( 3 ) : 355 - 368.
  • 9CHANDRA A,CHAKRABARTY K. Frequency-directed run-length(FDR) codes of with application to system on-a-chip test data compression[C]// Proceedings of the 19th IEEE VLSl Testing Symposium . Washington D C: IEEE ,2001 :42 - 47.
  • 10EL MALEH A,AL-ABAJI R. Extended frequency-directed run-length codes with improved application to system-on-a-C- hip test data compression[C]//Proceedings of International Conference Electronics, Circuits and System. Dubrovnik, Croatia : IEEE, 2002 :449 - 452.

引证文献2

二级引证文献2

计算机辅助设计与图形学学报
2008年 第2期

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