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Observing Nanometre Scale Particles with Light Scattering for Manipulation Using Optical Tweezers 被引量:3

Observing Nanometre Scale Particles with Light Scattering for Manipulation Using Optical Tweezers
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摘要 Nanometre-scale particles can be manipulated using optical tweezers, but cannot be directly observed. We present a simple method that nanoparticles can be directly observed using optical tweezers combined with dark field microscopy. A laser beam perpendicular to a tightly focused laser beam for trap illuminates specimen and does not enter objective, nanoparticles in focal plane all can be directly observed in dark field because of light scattering. It is implemented that the polystyrene beads of diameter lOOnm can be directly observed and trapped. Nanometre-scale particles can be manipulated using optical tweezers, but cannot be directly observed. We present a simple method that nanoparticles can be directly observed using optical tweezers combined with dark field microscopy. A laser beam perpendicular to a tightly focused laser beam for trap illuminates specimen and does not enter objective, nanoparticles in focal plane all can be directly observed in dark field because of light scattering. It is implemented that the polystyrene beads of diameter lOOnm can be directly observed and trapped.
机构地区 Department of Physics
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2008年第1期329-331,共3页 中国物理快报(英文版)
基金 Supported by the National Natural Science Foundation of China under Grant No 10474094, and the Knowledge Innovation Project of Chinese Academy of Sciences under Grant No KJCX2-SW-h12-O2.
关键词 TRAP CELLS TRAP CELLS
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  • 1Ashkin A, Dziedzic J M, Bjorkholm J E and Chu S 1986 Opt. Left. 11 288
  • 2Ghosh A, Sinha S, Dharmadhikari J A, Roy S, Dharmadhikari A K, Samuel J, Sharma S and Mathur D 2006 Phys. Biol. 3 67
  • 3Ericsson M, Hanstorp D, Hagberg P, Enger J and Nystrom T 2000 J. Bacteriol. 182 5551
  • 4Prikulis J, Svedberg F, Kall M, Enger J, Ramser K, Goksor M and Hanstorp D 2004 Nano Left. 4 115
  • 5Doornbos R M P, Schaeffer M, Hoekstra A G, Sloot P M A, deGrooth B G and Greve J 1996 Appl. Opt. 35 729
  • 6Ulanowski Z, Greenaway R S, Kaye P H and Ludlow I K 2002 Meas. Sci. Technol. 13 292
  • 7Huisken J, Swoger J, Del Bene F, Wittbrodt J and Stelzer E H K 2004 Science 305 1007
  • 8Engelbrecht C J and Stelzer E H K 2006 Opt. Left. 31 1477

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