摘要
目的旨在探讨脂蛋白脂酶基因第6内含子PvuⅡ酶切位点多态性与胰岛素抵抗、2型糖尿病的发生之间是否有关联。方法随机选取163例2型糖尿病患者作为病例组,106例正常人作为正常对照组,对第6号内含子PvuⅡ酶切位点进行多态性分析。结果病例组中P+P+组高密度脂蛋白胆固醇水平明显低于P-P-组,而血清三酰甘油、胰岛素抵抗指数指标水平高于P-P-组。结论PvuⅡ酶切位点多态性与2型糖尿病中胰岛素抵抗有关。
Objective To investigate the frequency of variant of lipoprotein lipase(LPL)gene,PvuⅡ at intron 6 ,and its relation to insulin resistance(IR) in type 2 diabetes mellitus. Methods PCR-RFLP method was used to determine the DNA polymorphism of 6th intron at LPL gene in 163 type 2 diabetes(T2DM)patients and 106 controls. Results The levels of TG and IR in P + P + genotype were higher than those in P-P-genotype ( P 〈0.05) ,but HDL-C was lower(P 〈 0.05). Conclusion The LPL-PvuⅡ-RFLP is significantly associated with insulin resistance in type 2 diabetes.
出处
《中国实用医药》
2008年第3期20-21,共2页
China Practical Medicine
关键词
2型糖尿病
胰岛素抵抗
脂蛋白脂酶基因
酶切位点多态性
Type 2 diabetes mellitus ( T2DM )
Insulin resistance
Lipoprotein lipase (LPL) gene
Restriction fragment length polymorphism(RFLP)