摘要
在电子产品的可靠性寿命试验中,如果产品本身的质量很好,或者受试验时间和费用等条件的限制,则有可能出现"无失效数据"的情况。针对这种情况,引进失效信息,在先验分布为Gamma分布时,对失效率进行了多层Bayes估计,并结合实际问题进行了计算。
The situation of zero-failure data may occur in the reliability life test of an electronic product when it has a high quality or the test time and fund are limited. In this case, when the prior distribution is Gamma distribution, the hierarchical Bayesian estimation for the failure rate is perfermed after introducing the failure information and calculation is carried out regarding to the practical problem.
出处
《电子产品可靠性与环境试验》
2008年第1期17-20,共4页
Electronic Product Reliability and Environmental Testing
关键词
电子产品
无失效数据
指数分布
失效率
贝叶斯估计
electronic product
zero-failure
exponential distribution
failurerate
Bayesian estimation
