摘要
在实际THZ负折射指数物质应用中,形状的改变和现有的光刻技术的精度,对负折射特性造成什么影响研究在实际工程设计中具有重要意义。下面利用有限积分法模拟形状变化和光刻精度产生的缺陷对负折射谐振频率和通带的影响。得出由于谐振环之间的耦合,SRR对称破缺影响谐振频率和通带。光刻技术的精度满足THZ负折射指数物质的要求。
In practical application of nano negative refractive index Metamaterials, the effects of shape change and optical printing precision on nano negative refractive index Metamaterials are very important. Finite integration technique (FIT) is used to simulate the effects of shape change and optical priming precision on resonant frequency and the pass band of negative refractive index material. Broken-symmetry of split ring resonators (SRR) has effect on resonant frequency and pass band because of the coupling between wires and SRR. Optical priming precision can accommodate the demand of perfect lens made of negative refractive index materials.
出处
《电子器件》
CAS
2008年第1期246-248,共3页
Chinese Journal of Electron Devices
基金
电波环境及模化技术国家重点实验室基金资助
国家自然科学基金资助(60678005)
高等学校博士学科点专项科研基金资助(20050698017)
关键词
纳米负折射指数物质
缺陷模
通带
光刻精度
nano negative refractive index metamaterial
defect mode
pass band,optical printing precision