BDD-2型电缆半导电电阻测量装置的研制

Development of the BDD-2 Test Apparatus for Resistance Measurement for the Semicondutive Layer in Cables

本文以BDD-2型电缆半导电电阻测量装置为例,介绍了电缆半导电层电阻测量的特点,主要是测量装置的特殊要求及测量功率、量程、分辨率及装置的使用技巧。该装置经国家电线电缆质量监督检验中心四年多使用,并经机械工业电线电缆专用测试设备检测中心检测,全面符合GB/T 3048.3-1994等标准对检测设备的技术要求。

This paper presents the characteristics of the resistance measurement for the semiconductive layer in cables （mainly the special requirements for the test apparatus as well as measuring power, range, resolution and the techniques to use the apparatus） , taking BDD-2 Test Apparatus as an example. The use of 4-plus years by the National Supervision and Testing Centre for Wire and Cable and inspection by the Inspection Centre for the Test Apparatus for Wire and Cable proved that the apparatus complies fully with the technical requirements of GB/T 3048.3-1994 for test apparatus.