单片集成TFT-LCD驱动芯片内置SRAM验证技术研究

Verifications of Built-in SRAM for One-chip TFT-LCD Driver IC

介绍了TFT-LCD驱动芯片内置SRAM验证方法:(1)采用模拟验证和形式验证相结合的前端设计验证方法,完成各模块的功能验证及整个SRAM的功能和时序验证。模拟验证技术,利用模拟工具对被测试模块施加测试激励信号,检查输出信号是否符合预期要求;模拟方法可以同时检查被测试模块的功能及时序方面的响应情况,能够全面体现电路的行为。形式验证技术,在集成电路设计中,是通过算法的手段进行等价性检查,比较两种设计之间的功能等价性。(2)采用结构化抽取寄生参数和建立关键路径的方法,完成SRAM性能的评估,即后端设计验证。并且用具体实例详细描述了以上方法在电路仿真验证中的应用,并给出了部分电路结构及仿真结果,进一步论述了该方法的可行性及实用性。

This paper mainly introduces two verification methods of built-in SRAM for one-chip TFT-LCD driver IC. （1）Simulation verification combined with form verification, which is used for the function verification of every module and the function and sequence verification of whole SRAM. Simulation verification, it utilizes the simulation tools to input stimulus on the tested module, check that the output signal accords with the anticipated requirement. This simulation method may simultaneously inspect the response of the tested module in function and sequence,which also expressed the circuit behavior from all aspects. The form verification technology, in the integrated circuit design, carried on its inspection through different algorithm. The most commonly way for form verification is through Equivalent Inspection to compare the function equivalent between the two different designs. The simulation confirmation and the formal verification are front end which this article needs to introduce design the confirmation. （2）Structure extracting of parasitic parameter and setting of critical path, which is used for the evaluations of SRAM properties. Some design examples are given to demonstrate the feasibility and the usability of proposed method.