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A device for fluorescence temperature measurement based on fast fourier transform

A device for fluorescence temperature measurement based on fast fourier transform
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摘要 A sapphire fiber thermal probe with Cr3+ ion-doped end was grown using the laser heated pedestal method. The fluorescence thermal probe offers advantages of compact structure, high performance and the ability to sustain high temperature from the room temperature to 450 oC. Based on the fast fourier transform (FFT), the fluorescence lifetime is obtained from the tangent function of the phase angle of the first non-zeroth item of FFT result. Compared with other traditional fitting methods, our method has advantages such as fast speed, high accuracy and being free from the influence of the base signal. The standard deviation of FFT method is about half of that of the Prony method and close to the one of the Marquardt method. In addition, since the FFT method is immunity to the background noise of the signal, the background noise analysis can be skipped. A sapphire fiber thermal probe with Cr^3+ ion-doped end was grown using the laser heated pedestal method. The fluorescence thermal probe offers advantages of compact structure, high performance and the ability to sustain high temperature from the room temperature to 450℃. Based on the fast fourier transform (FFT), the fluorescence lifetime is obtained from the tangent function of the phase angle of the first non-zeroth item of FFT result. Compared with other traditional fitting methods, our method has advantages such as fast speed, high accuracy and being free from the influence of the base signal. The standard deviation of FFT method is about half of that method. In addition, since the FFT method is immunity to analysis can be skipped. of the Prony method and close to the one of the Marquardt the background noise of the signal, the background noise
出处 《Optoelectronics Letters》 EI 2008年第2期147-149,共3页 光电子快报(英文版)
基金 the Natural Science Research Foundation of Education Bureau of Hebei Province, China (Grant No.2001265)
关键词 傅立叶转移 器件 荧光温度 测量方法 CLC numbers TN247
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参考文献9

  • 1YE Lin-hua. Infrared&Millimeter Wave . 1997
  • 2KTV Grattan,A W Palmer,and Z Zhang. The Review of Scientific Instruments . 1991
  • 3R R Sholes,and J G Small. The Review of Scientific Instruments . 1980
  • 4ZHANG Zhi-yi,TV Grattan,and AW Palmer. Physical Review B Condensed Matter and Materials Physics . 1993
  • 5S.A.Wade,J.C.Muscat,,and S.F.Collins. The Review of Scientific Instruments . 1999
  • 6YE Lin-hua,SHEN Zhong-ping,and ZHAO Wei-zhong. Photoelectron&Laser . 2002
  • 7Z.Y.Zhang,K.T.V.Grattan,,and A.W.Andrew. Proceedings of SPIE the International Society for Optical Engineering . 1995
  • 8T.Sun,Z.Y.Zhang,,K.T.V.Grattan. The Review of Scientific Instruments . 1997
  • 9Z.Y.Zhang,,K.T.V.Grattan,,and A.W. Palmer. Review of Sci- entific Instruments . 1998

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