摘要
首先对闪速存储器的发展现状进行了评述;然后从结构和失效机理出发,对影响闪速存储器可靠性的各因素进行分析;并提出了改进方法。
This paper first describes the developing situation of flash memory and then analyzes various factors which ihfluence the reliability of flash memory, based on the structure and failure mechanism. At last it proposes some methods to improve the reliability.
出处
《微处理机》
1997年第3期1-4,共4页
Microprocessors