原位聚合(PSS/PANI)_n复合膜的静电层-层自组装

Layer-by-layer self-assembly of in-situ polymerized(PSS/PANI)_n composite films based on electrostatic interaction

基于静电相互作用，从苯胺单体出发原位聚合、现场掺杂、层-层自组装制备多层聚苯乙烯磺酸钠（PSS）／聚苯胺（PANI）复合膜。为了明确控制PSS／PANI复合膜纳米结构的因素，以紫外-可见（UV—Vis）光谱跟踪PSS／PANI复合膜的成膜过程，系统地研究了基片性质、氧化剂用量及沉积时间等溶液因素对单个双层复合膜纳米结构的影响，得到了制备单个双层复合膜的较优条件。在此基础上变换苯胺单体浓度，制备了不同纳米结构的多层复合膜（PSS／PANI）n，并用原子力显微镜（AFM）、扫描电镜（SEM）及椭偏仪等对该多层复合薄膜的形貌结构进行了表征。结果表明，通过控制沉积条件，每双层复合膜的厚度可控制在40～100nm，电导率可达2．675mS·cm^-1,并且可制备增长均匀的8个双层的（PSS／PANI）n。复合膜。热失重分析（TGA）表明，（PSS／PANI）n多层复合膜的热稳定性优于普通PSS／PANI复合膜。

The sodium polystyrene sulfonate （PSS） / polyaniline（PANI）eomposite films were prepared from aniline （AN） monomers by in-situ polymerization, self-acid-doping and layer-by-layer self-assembly through the electro- static force. In order to completely know the factors to control the nanostrueture, the progress of polymerization of the PSS/PANI films was monitored by the UV-Vis spectra, and the influences of reaction conditions, such as substrates, amounts of oxidant, and dipping time on the structure of PSS / PANI composite films were also studied. The （PSS/PANI）n composite films with different nanostruetures were then prepared at different aniline concentrations. Atomic force microscope （AFM）, field emission scanning electron microscope （FESEM） and ellipsometry were employed to characterize the （PSS/PANI）n composite films. By optimizing the deposition conditions, the thickness of the PSS/PANI bilayer was controlled within 40 ～ 100 nm and the electrical conductivity of the PSS/ PANI bilayer was 2. 675 mS· cm^-1. The uniform （PSS/PANI）n composite films were also prepared under the optimumconditions. The results of the thermal gravimetry analysis （TGA） showed that the thermal stability of （PSS/PANI）n composite films was stronger than that of general PANI / PSS composite films.