摘要
以焊料(Sn-3.5Ag)在薄铜基片之间制作截面积约为1 mm2,厚度分别为0.42 mm和0.10 mm的试样(其面积与电子封装中的无铅焊点面积大体相同)为对象,利用特制的电子测试系统实时、在线测量试样焊点的微电阻及其剪切应力,并通过串行接口将相关数据传输至计算机。数据经计算机处理后,拟合成实时微电阻和测试时间的关系曲线。基于经典的Griffith断裂模型,建立一个简易数学模型,从理论上论证电阻应变与焊点机械蠕变裂纹之间的关系。研究结果表明:该关系曲线反映焊点的裂纹连续生长、蠕变失效过程,变化趋势与经典结果吻合;在24 MPa应力作用下,厚度为0.42 mm的试样最大电阻应变为0.18,最大电阻应变率为2.2×10-3 s-1;在25 MPa应力作用下,厚度为0.10 mm试样的最大电阻应变为0.036,最大电阻应变率为3.5×10-3 s-1,实验持续时间较厚度为0.42 mm的试样短。
Single shear lap creep specimens with a 1 mm2 cross sectional area and thickness of 0.42 mm and 0.10 mm, respectively (similar in size to small lead-free solder joints used in electronic packaging and jointing) between thin copper strips were fabricated using lead-free solder (Sn-3.5Ag) to quantify their creep strains with in situ micro electronic-resistance measurement. The solder joints' micro electronic-resistance and stress were in situ measured by a tailor-made electronic testing system and recorded by a PC via serial port, then all data of micro electronic-resistance and elapsing time were displayed in curves. The results show that the relationship between microelectronic-resistance and testing time reflects the continual development of damage and fracture mechanisms. Under a shear stress of 24 MPa, the maximum value of electronic-resistance strain of specimen with thickness 0.42 mm is 0.18. The maximum rate of electronic-resistance strain measurement is 2.2×10^-3s^-1. Under a shear stress of 25 MPa, the highest electronic-resistance strain value of specimen with thickness 0.10 mm is lower, which is 0.036. The maximum rate of electronic-resistance strain measurement is 3.5×10^-3s^-1.
出处
《中南大学学报(自然科学版)》
EI
CAS
CSCD
北大核心
2008年第1期80-85,共6页
Journal of Central South University:Science and Technology
基金
国家自然科学基金资助项目(50576076)
关键词
无铅焊点
微电阻
蠕变应变
电阻应变
lead-free solder joint
micro resistance
creep strain
electronic-resistance strain