期刊文献+

气相沉积bcc薄膜时的织构与价电子结构的关系 被引量:1

Relationship between the texture and the valence electron structure of bcc thin films vapor deposited on polycrystal or amorphous substrate
下载PDF
导出
摘要 应用固体与分子经验电子理论计算了不同bcc金属中团簇的共价电子对总数,结合团簇键能与气相沉积过程中的形核率的关系,认为在非晶或多晶基底上气相沉积bcc金属薄膜时,在较低温度不出现织构;在适当的温度下最可能出现(110)平行基底的织构,(112)、(100)的织构也可能出现,但不会出现(111)织构;温度升高将使不同取向的织构先后消失。推测与现有实验事实符合较好。这一理论和方法还可以继续扩展到hcp金属和化合物等其它薄膜的织构研究。 The total number of covalent electron pairs of the clusters in bcc metals was calculated. Combining the calculation results with the relationship between the bond energies of the clusters and their nucleation rates during vapor deposition, the following deductions were obtained. When bcc films are vapor deposited on polycrystal or amorphous substrate, no texture will forms if the temperature is low. At proper temperature range, the most possible texture is the (110) paralleling the surface of the substrate, Meanwhile the (112) or (100) texture may also appear, but the (111 ) texture will not appear. When the temperature is too high, the different textures will disappear early or later. The deductions accord well with existing experiment results. These theory and method can also be expanded to the researches of the textures of other films such as hop metals or compounds.
出处 《材料热处理学报》 EI CAS CSCD 北大核心 2008年第1期171-175,共5页 Transactions of Materials and Heat Treatment
基金 教育部科技基金重点项目(02018) 北京市自然科学基金项目(2072014)
关键词 bcc金属 气相沉积 织构 电子理论 bcc metal vapor deposition texture electron theory
  • 相关文献

参考文献13

  • 1Grantscharova E. Texture transition in thin metal films vacuum condensed on glass: a general consideration[J]. Thin Solid Films, 1993, 224:28 - 32.
  • 2Shi Z, Craib G R G, Player M A, et al. Texture development of evaporated nickel films on molybdenum substrates[ J ]. Thin Solid Films, 1997, 304:170 - 177.
  • 3Jiang X, Schiffmann K, Klages C P. Coalescence and overgrowth of diamond grains for improved heteroepitaxy on silicon (001)[J]. Journal of Applied Physics, 1998, 83(5) :2511 - 2518.
  • 4WANG Lian-shan, LIU Xiang-lin, ZAN Yu-de, et al. Wurtzite GaN epitaxial growth on a Si(001) substrate using T- Al2O3 as an intermediate layer[J]. Appl Phys Left, 1998, 72(5) :109- 111.
  • 5Walton D. Nucleation of vapor deposits[J]. The Journal of Chemical Physics, 1962, 37(10) :2182 - 2188.
  • 6Walton D. The orientation of vapour deposits[J]. Philosophaical Magazine, 1962, 7(82) : 1671 - 1679.
  • 7LI Zhi-lin, XU Hul-bin, GONG Sheng-kai. Texture formation mechanism of vapor deposited f. c. c thin film on polycrystal or amorphous substrate[ J ]. Journal of Physical Chemistry B, 2004, 108(39) :15165 - 15171.
  • 8Park K S, Park J K. Effects of deposition parameters on the texture of chromium films deposited by vacuum arc evaporation[J]. Aeta Mater, 1999, 47(7), 2177 - 2184.
  • 9Lee S L, Windover D. Phase, residual stress, and texture in triode-sputtered tantalum coating on steel[J]. Surface and Coatings Technology, 1998, 108 - 109:65 - 72.
  • 10Gautier C, Moulard G, Chatelon J P, et al. Influence of substrate bias voltage on the in situ stress measured by an improved optical cantilever technique of sputtered chromium films[J]. Thin Solid Films, 2001, 384:102- 108.

二级参考文献1

  • 1曲喜新.薄膜物理[M]上海科学技术出版社,1986.

同被引文献6

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部