金刚石复合界面扩散系数的电子探针研究

An EPMA Study of Diffusion Coefficients across the Interface between Diamond and Tungsten Carbide

结合金刚石与硬质合金复合材料的研究，对含轻元素的界面扩散问题提出了能谱仪与波谱仪原位互补分析研究的方法，从扩散深度和扩散浓度分布两种角度探讨了扩散系数的电子探针测定；同时讨论了该方法在金刚石与硬质合金复合钻头上的应用。

The interfacial diffusion of light elements between diamond and hard alloys,e.g.,tungsten carbide,has been studied by an electron probe microscopic analysis in situ ,complemented by both energy dispersive X ray spectrometry (EDS) and wave dispersive X ray spectrometry (WDS).The diffusion coefficients of cobalt,tungsten,and diamond can be obtained either by the diffusion depth approach or by the diffusion concentration distribution approach.The applicability of this method in composite bit study is discussed.