摘要
微型杜瓦封装是红外焦平面探测器组件的封装形式之一,而真空寿命则是红外焦平面杜瓦组件的关键技术指标之一。通过分析影响杜瓦真空寿命的因素,建立了适合微型杜瓦真空寿命的加速试验模型,确定了其加速应力和水平,并用实验数据的统计分析方法对杜瓦的真空寿命可靠性分布作了进一步的估计。
A micro Dewar package is one of the packaging forms of an infrared focal plane detector assmbly and the vacuum life is one of the key technical parameters of the Dewar assembly for an infrared focal plane detector. In this parper, the factors affecting the vacuum life of a Dewar is analyzed. An accelerated vacuum life test model suitable for micro Dewars is established and its accelerated stress level is determined. Finally, the reliability distribution of the vacuum life of a micro Dewar is further estimated by using an experimental data statistical method.
出处
《红外》
CAS
2008年第3期11-15,共5页
Infrared
关键词
微型杜瓦
真空寿命
加速寿命试验
micro metal Dewar
vacuum life
accelerated life test
